Lorlin
Lorlin Test Systems® manufactures and distributes discrete semiconductor component test systems that run under the Intel® based Windows 10® 64-BIT operating system with USB 2.0 tester interface. Through years of engineering excellence, proven designs and achievements, Lorlin® is proud to maintain the leading edge of the technology offered in our products. Lorlins dynamic and comprehensive solutions are tailored to the specific needs and requirements of our customers and are suitable for nearly any test application. For over 50 years, proven excellence in analog and digital electronic engineering utilizing advanced circuits and techniques is why engineers demand Lorlin products so much. Our vision for the research and development required to meet todays demands came to fruition several years ago. Engineering excellence with fluidity, perfection and flow has resulted in success with complete customer satisfaction and confidence in the performance of Lorlins equipment. Our test concepts are developed in an environment of creative flux and intuition, and the achievements are unmatched. Our flexibility and creativity allow us to meet your application needs and targeted test and manufacturing goals while staying within your budget. Parametric test equipment is used to test, evaluate and analyze the electrical characteristics of semiconductor devices in component test and semiconductor manufacturing applications such as production and final test, wafer probe and wafer mapping, QC&&QA testing, incoming material inspection, engineering evaluation and characterization, high reliability and high volume test.